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A new adaptive analog test and diagnosis system
2000
IEEE Transactions on Instrumentation and Measurement
This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The diagnosis method consists on injecting probable faults in a mathematical model of the circuit, and later comparing its output with the output
doi:10.1109/19.843053
fatcat:e3ly67yp7faufjhyaiar2pquyy