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Understanding filamentary growth and rupture by Ag ion migration through single-crystalline 2D layered CrPS4
2020
NPG Asia Materials
AbstractMemristive electrochemical metallization (ECM) devices based on cation migration and electrochemical metallization in solid electrolytes are considered promising for neuromorphic computing systems. Two-dimensional (2D) layered materials are emerging as potential candidates for electrolytes in reliable ECM devices due to their two-dimensionally confined material properties. However, electrochemical metallization within a single-crystalline 2D layered material has not yet been verified.
doi:10.1038/s41427-020-00272-x
fatcat:qomjxudurvcrxe3z3co4f2cevm