Stable and Flexible Side-Entry Stage for Nion STEMs

Michael T. Hotz, George Corbin, Niklas Delby, Tracy C. Lovejoy, Gwyn Skone, Jean-Denis Blazit, Mathieu Kociak, Odile Stephan, Marcel Tencé, Henny W. Zandbergen, Ondrej L. Krivanek
2017 Microscopy and Microanalysis  
Aberration-corrected scanning transmission electron microscopes (STEMs) can resolve single atoms, probe them spectroscopically, and produce elemental and chemical maps with atomic resolution in 2D and 3D. When equipped with a monochromator and operating in an aloof mode, STEMs can record vibrational electron energy loss spectra (vib-EELS) to create nm-scale vibrational maps while avoiding radiation damage. These techniques require excellent short-term (vibration) and long-term (drift) stability
more » ... m (drift) stability of the microscope's sample stage. 54
doi:10.1017/s1431927617000952 fatcat:gio3lkpnhnczhnlksrfo45ir5a