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The damage induced by radiation in detector sensors and electronics requires that critical environmental parameters such as leakage currents of the silicon detectors, local temperatures and supply voltages are carefully monitored. For the CMS central tracker, an ASIC, the Detector Control Unit (DCU) has been developed to monitor these quantities in a commercial sub-micron technology. A set of layout design rules guarantees for this device the radiation hardness that is requested for the LHCdoi:10.5170/cern-2001-005.338 fatcat:tpu4hd5zvvfp3ka57egh77shze