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On-Line Testing for VLSI
In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not completely random pattern testable, the test programs have to generate deterministic patterns after random testing. Usually the random test part of the program requires long run times whereas the part for deterministic testing has high memory requirements. In this paper it is shown that an appropriate selection of the randomdoi:10.1007/978-1-4757-6069-9_12 fatcat:gzod7bdmmrdwrdhv6epi5ck4dm