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The Transition Between Amorphous Regrowth and Explosive Crystallization
1986
Materials Research Society Symposium Proceedings
Preserved Fulltext
Cover: Time-resolved reflectivity measurements from the front (upper curves) and the rear (lower curves) on pulsed-laser annealing of 440 nm amorphous silicon on 60 nm crystalline silicon on sapphire. See also figure III.21. Aan mijn ouders, Janneke, Bram en Annelies CONTENTS: I. 103 105 105 107 109 V.5 Final Discussion References Chapter V SUMMARY SAMENVATTING DANKWOORD LEVENSLOOP Proceedings of the X I th Congres on Electron Microscopy, pages 1521-1522 (1986). Between explosive
doi:10.1557/proc-74-91
fatcat:y7g6rwsi2rcttpmewm2fr3lvla