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Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
[article]
2020
arXiv
pre-print
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination
arXiv:2008.12768v1
fatcat:llrkwaz2bvhrlchmh3hqrs34p4