A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2020; you can also visit the original URL.
The file type is application/pdf
.
An Integrated DC/DC Converter with Online Monitoring of Hot-Carrier Degradation
2019
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
An integrated DC/DC converter with online monitoring of the degradation level of power MOSFETs due to hot-carrier injection (HCD) is proposed. The converter is able to dynamically estimate the on-resistance of the power switches and to provide its value to the user during normal operation. In fact, the correlation between an increase in on-resistance of power switches and HCD is fully documented, and it can be exploited to perform an estimation of degradation. The presented solution, developed
doi:10.1109/icecs46596.2019.8964721
dblp:conf/icecsys/PizzottiCTR19
fatcat:dlpde7nqgjcv7pgx34f4hb7zhq