An Integrated DC/DC Converter with Online Monitoring of Hot-Carrier Degradation

Matteo Pizzotti, Marco Crescentini, Andrea Natale Tallarico, Aldo Romani
2019 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)  
An integrated DC/DC converter with online monitoring of the degradation level of power MOSFETs due to hot-carrier injection (HCD) is proposed. The converter is able to dynamically estimate the on-resistance of the power switches and to provide its value to the user during normal operation. In fact, the correlation between an increase in on-resistance of power switches and HCD is fully documented, and it can be exploited to perform an estimation of degradation. The presented solution, developed
more » ... n STMicroelectronics 90nm BCD technology, features a non-invasive current sensing and voltage sampling architecture, which is applied to a common boost DC/DC converter to evaluate the resistance of the switching power MOSFET. Without lack of generality, this specific sensing structure can be applied to any kind of converter, e.g. buck or buck-boost, as it doesn't require any change in the main conversion circuit.
doi:10.1109/icecs46596.2019.8964721 dblp:conf/icecsys/PizzottiCTR19 fatcat:dlpde7nqgjcv7pgx34f4hb7zhq