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Influence of film thickness on the crystallization of Ni-doped amorphous silicon samples

F. A. Ferri, A. R. Zanatta
2008 Journal of Applied Physics  

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doi:10.1063/1.2955457 fatcat:u6pyz7c7ozbx3ampefom7ir6fm
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F. A. Ferri, A. R. Zanatta. "Influence of film thickness on the crystallization of Ni-doped amorphous silicon samples." Journal of Applied Physics 104.1 (2008) 013534