Analytical drain current model reproducing advanced transport models in nanoscale double-gate (DG) MOSFETs

M. Cheralathan, C. Sampedro, J. B. Roldan, F. Gamiz, G. Iannaccone, E. Sangiorgi, B. Iniguez
2011 Ulis 2011 Ultimate Integration on Silicon  
doi:10.1109/ulis.2011.5757954 fatcat:sjkpabummfd7vpm7zwqdhjual4