A new Logic NVM "eCFlash (embedded CMOS Flash)" has been developed without any additional process steps in a 0.25um technology. In this architecture, a novel differential sense-latch cell with charge-trapping storage is adopted. This unique cell structure functions as a differential sense amplifier as well as a data latch, therefore mass data can be restored to each cell's latch simultaneously for static data output with high sensitivity and low power consumption. Furthermore the handling

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... of twice the breakdown voltage with novel charge pump circuit and high voltage driver is demonstrated. By utilizing these techniques, a highly reliable Logic NVM is realized; 100K cycling endurance and data retention of 20years at 150C.