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IFIP Advances in Information and Communication Technology
Scan-based design-for-testability, which improves access and thus the test quality, is highly vulnerable to scan attack. While in-field test is enabled through the scan design to provide debug capabilities, an attacker can leverage the test mode to leak the secret key of the chip. The scan attack can be thwarted by a simple defense that resets the data upon a switch from the normal mode to the test mode. We proposed a new class of scan attack in  using only the test mode of a chip,doi:10.1007/978-3-319-23799-2_3 fatcat:tzw4hqzrh5abxkfsbf56ljomre