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Dynamic Selection of Trace Signals for Post-Silicon Debug
2013
2013 14th International Workshop on Microprocessor Test and Verification
Post-silicon validation is one of the most expensive and complex tasks in today's System-on-Chip (SoC) design methodology. A major challenge in post-silicon debug is limited observability of the internal signals. Existing approaches address this issue by selecting a small set of useful signals. These signal states are stored in an on-chip trace buffer during execution. The applicability of existing methods is limited to a specific debug scenario where every component has equal importance all
doi:10.1109/mtv.2013.13
dblp:conf/mtv/BasuMPNA13
fatcat:e4mjrqvjmbajrcqhf76g4e3ody