The sensitivity of a method to predict a capacitor's frequency characteristic

S. Avramov-Zamurovic, A.D. Koffman, N.M. Oldham, B.C. Waltrip
<span title="">2000</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="" style="color: black;">IEEE Transactions on Instrumentation and Measurement</a> </i> &nbsp;
A joint effort between the U.S. Naval Academy and the National Institute of Standard and Technology (NIST) resulted in the development of a method to characterize the capacitance and dissipation factor of a set of commercial standard four terminal-pair (4TP) capacitors. The method depends on network analyzer impedance measurements at high frequencies (40 MH-200 MHz) and a regression of these measurements down to the frequency range of 10 MHz-1 kHz. This paper provides an analysis of the
more &raquo; ... ity of the regression parameters and the high-frequency impedance measurements.
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="">doi:10.1109/19.843085</a> <a target="_blank" rel="external noopener" href="">fatcat:laapnmkucrfsnayb6qeaq6hxmu</a> </span>
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