Sample Optimization for In Situ Lamella Preparation for Cryo Electron Tomography

John Mitchels, Miroslav Peterek, Jiri Novacek
2017 Microscopy and Microanalysis  
Cryo Electron Tomography is emerging as a technique which enables the extension of structural biology from solely purified structures, to the dynamic complexity of the cell [1]. Focused Ion Beam (FIB-SEM) erosion under cryogenic temperatures offers researchers a way of producing damage and artefact free lamella which can be utilized in high end tomography tools such as the FEI Titan Krios™. Several Cryo-FIB prototype tools exist and have been producing significant results utilizing the 'in
more » ... approach [2,3,4]. Correct preparation of samples for in situ lamella prep is critical for making use of this emerging technique. There are many steps where the sample can be significantly contaminated or even completely damaged which would prevent from collection of high-quality cryo-electron tomography data. Standardization of the whole process of ablation of cellular material and sample handling is required to provide sufficient yield of high-quality samples for TEM imaging. 1366
doi:10.1017/s1431927617007498 fatcat:zgqzagarizfing3hqd3o4onaxu