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Sample Optimization for In Situ Lamella Preparation for Cryo Electron Tomography
Microscopy and Microanalysis
Cryo Electron Tomography is emerging as a technique which enables the extension of structural biology from solely purified structures, to the dynamic complexity of the cell . Focused Ion Beam (FIB-SEM) erosion under cryogenic temperatures offers researchers a way of producing damage and artefact free lamella which can be utilized in high end tomography tools such as the FEI Titan Krios™. Several Cryo-FIB prototype tools exist and have been producing significant results utilizing the 'indoi:10.1017/s1431927617007498 fatcat:zgqzagarizfing3hqd3o4onaxu