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Image formation, resolution, and height measurement in scanning ion conductance microscopy
2009
Journal of Applied Physics
Scanning ion conductance microscopy ͑SICM͒ is an emerging tool for the noncontact investigation of biological samples such as live cells. It uses an ion current through the opening of a tapered nanopipette filled with an electrolyte for topography measurements. Despite its successful application to numerous systems no systematic investigation of the image formation process has yet been performed. Here, we use finite element modeling to investigate how the scanning ion conductance microscope
doi:10.1063/1.3122007
fatcat:mkaeym2vyzbi7cu3xpa7zabluy