Image correction for atomic force microscopy images with functionalized tips

M. Neu, N. Moll, L. Gross, G. Meyer, F. J. Giessibl, J. Repp
2014 Physical Review B  
It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the cantilever is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.
doi:10.1103/physrevb.89.205407 fatcat:mp5kkrffcbgr7hfw7hnpone7ee