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Object oriented design pattern decay
2010
Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement - ESEM '10
Software designs decay over time. While most studies focus on decay at the system level, this research studies design decay on well understood micro architectures, design patterns. Formal definitions of design patterns provide a homogeneous foundation that can be used to measure deviations as pattern realizations evolve. Empirical studies have shown modular grime to be a significant contributor to design pattern decay. Modular grime is observed when increases in the coupling of design pattern
doi:10.1145/1852786.1852796
dblp:conf/esem/SchanzI10
fatcat:mgecqnytxbad5f7b7zl3vog5im