A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2011; you can also visit the original URL.
The file type is application/pdf
.
On Reducing Circuit Malfunctions Caused by Soft Errors
2008
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
Soft errors due to radiation are expected to increase in nanoelectronic circuits. Methods to reduce system failures due to soft errors include use of redundancy and making circuit elements robust such that soft errors do not upset signal values. Recent works have noted that electronic circuits have partial intrinsic immunity to soft errors since single event upsets on a large percentage of signal lines do not cause errors on circuit outputs. Using ISCAS-89 benchmark circuits we present
doi:10.1109/dft.2008.20
dblp:conf/dft/PolianRPTB08
fatcat:f6b7jwcjeffhlkkt5pjd57n2fq