Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process

Kuan-Chang Chang, Tsung-Ming Tsai, Rui Zhang, Ting-Chang Chang, Kai-Huang Chen, Jung-Hui Chen, Tai-Fa Young, J. C. Lou, Tian-Jian Chu, Chih-Cheng Shih, Jhih-Hong Pan, Yu-Ting Su (+6 others)
2013 Applied Physics Letters  
doi:10.1063/1.4819162 fatcat:cqkzldkwp5aslibxbcazddbo4e