ZnS sculptured thin films produced by thermal evaporation method using the glancing angle deposition technique at different deposition angles (0, 30, 60, 70 and 80 • ) are reported. The structural and optical properties of the prepared samples are investigated systematically using X-ray diffraction (XRD) and UV-VIS spectroscopy techniques. The XRD studies show cubic structure for the prepared films and deposition angle dependence of lattice constants, intrinsic stress, tensile stress and

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... tion density. The obtained transmittance spectra in the range 380-850 nm for both s-and p-polarized light at normal incidence angle are used to study the s-and p-refractive indices and in-plane birefringence of the ZnS films. The maximum birefringence is evaluated at incident flux angle α = 70 • . Both the refractive index and packing density of the films decrease with increasing deposition angle, which confirm the structural inhomogeneity and porosity nature of the films.