Measured Descent: A New Embedding Method for Finite Metrics

R. Krauthgamer, J.R. Lee, M. Mendel, A. Naor
45th Annual IEEE Symposium on Foundations of Computer Science  
doi:10.1109/focs.2004.41 dblp:conf/focs/KrauthgamerLMN04 fatcat:7zx3ygbfzvcnblp4zkqpwvgjna