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Integrated test scheduling, test parallelization and TAM design
Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).
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1 We propose a technique integrating test scheduling, scan chain partitioning and test access mechanism (TAM) design minimizing the test time and the TAM routing cost while considering test conflicts and power constraints. Main features of our technique are (1) the flexibility in modelling the systems test behaviour and (2) the support for interconnection test of unwrapped cores and user-defined logic. Experiments using our implementation on several benchmarks and industrial designs demonstrate
doi:10.1109/ats.2002.1181744
dblp:conf/ats/LarssonAFP02
fatcat:ernjrkcwvzd5nluipi37p7cfb4