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Development of a silicon drift detector array: an x-ray fluorescence spectrometer for remote surface mapping
Instruments and Methods for Astrobiology and Planetary Missions XII
Over the past three years NASA Marshall Space Flight Center has been collaborating with Brookhaven National Laboratory to develop a modular Silicon Drift Detector (SDD) X-Ray Spectrometer (XRS) intended for fine surface mapping of the light elements of the moon. The value of fluorescence spectrometry for surface element mapping is underlined by the fact that the technique has recently been employed by three lunar orbiter missions; Kaguya, Chandrayaan-1, and Chang'e. The SDD-XRS instrument wedoi:10.1117/12.826389 fatcat:zdh2embup5hetfpwpi773p4lzu