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Large enhancement of anisotropic magnetoresistance and thermal stability in Ta/NiFe/Ta trilayers with interfacial Pt addition
2010
Applied Physics Letters
Preserved Fulltext
Ta/NiFe/Ta trilayers, extensively used for anisotropic magnetoresistance ͑AMR͒ sensors, exhibit severely reduced MR ratio at small NiFe thickness and appreciable moment loss, especially after annealing. By inserting ultrathin Pt layers at the interfaces of the trilayers, AMR can be significantly enhanced for thin NiFe films due to the strong electron spin-orbit scattering at Pt/NiFe interfaces along with suppression of interfacial magnetic dead layers. Furthermore, the Pt layers also reduce Ta
doi:10.1063/1.3334720
fatcat:6qfi5r27jja6dir3bzoac7bzsa