Investigation of Individual Micrometer-Size Kosa Particle with On-Site Combination of Electron Microscope and Synchrotron X-Ray Microscope

Yoichi TANAKA, Yuji TANIGUCHI, Daisaku TANAKA, Masatoshi TOYODA, Hideshi ISHII, Teruo TANABE, Yasuko TERADA, Shinjiro HAYAKAWA, Jun KAWAI
2005 Analytical Sciences  
doi:10.2116/analsci.21.839 pmid:16038506 fatcat:o2fvv6xq3rfyhd6a4c26thj6ba