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Ziebold's article "Precision and Sensitivity in Electron Microprobe Analysis", 50 years later
2021
Zenodo
Preserved Fulltext
Ziebold's determination of of X-ray spectral devices resolution for quantitative X-ray spectral electron-probe microanalysis is analyzed. It was shown that the criterion proposed by Ziebold is not the limit of detection in the case of analysis of a two-component sample. The result can be substantially improved This article proposes a critical analysis of international standards for determining the resolution of X-ray spectral devices, methods for solving the equations of X-ray spectral
doi:10.5281/zenodo.4904362
fatcat:mgi6b3koanegbbxfklwophtcve