Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Martha V. O'Bryan, Kenneth A. LaBel, Jonathan A. Pellish, Jean-Marie Lauenstein, Dakai Chen, Cheryl J. Marshall, Timothy R. Oldham, Hak S. Kim, Anthony M. Phan, Melanie D. Berg, Michael J. Campola, Anthony B. Sanders (+8 others)
2010 2011 IEEE Radiation Effects Data Workshop  
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary oftest results.
doi:10.1109/redw.2010.6062500 fatcat:2fpee2ek7bcmtb5fdxzbybjc2q