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Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Martha V. O'Bryan, Kenneth A. LaBel, Jonathan A. Pellish, Jean-Marie Lauenstein, Dakai Chen, Cheryl J. Marshall, Timothy R. Oldham, Hak S. Kim, Anthony M. Phan, Melanie D. Berg, Michael J. Campola, Anthony B. Sanders (+8 others)
2010 2011 IEEE Radiation Effects Data Workshop  

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We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary oftest results.
doi:10.1109/redw.2010.6062500 fatcat:2fpee2ek7bcmtb5fdxzbybjc2q
Citation

Martha V. O'Bryan, Kenneth A. LaBel, Jonathan A. Pellish, Jean-Marie Lauenstein, Dakai Chen, Cheryl J. Marshall, Timothy R. Oldham, Hak S. Kim, Anthony M. Phan, Melanie D. Berg, Michael J. Campola, Anthony B. Sanders, Paul W. Marshall, Michael A. Xapsos, David F. Heidel, Kenneth P. Rodbell, Jim W. Swonger, Don Alexander, Michael Gauthier, Brian Gauthier. "Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems." 2011 IEEE Radiation Effects Data Workshop (2010)