Molecular Imaging of Chemical Compounds in Plant Tissue by Time-of-flight Secondary Ion Mass Spectrometry
飛行時間型2次イオン質量分析法による植物組織の分子レベル観察

Kaori SAITO, Kazuhiko FUKUSHIMA
2013 Seibutsu Butsuri  
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a non-destructive technique that allows for direct imaging of molecular ions with high spatial resolution on sample surface. In this review, the application of TOF-SIMS imaging at the cellular level in the investigation of wood chemical components including lignin is described. imaging / molecular mapping / TOF-SIMS / lignin / plant tissue 1 3
doi:10.2142/biophys.53.024 fatcat:da4u5zbn6rcxzglmskfarkpzji