Testing Analog and Mixed-Signal Circuits With Built-In Hardware—A New Approach

Sunil R. Das, Jila Zakizadeh, Satyendra Biswas, Mansour H. Assaf, Amiya R. Nayak, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu
2007 IEEE Transactions on Instrumentation and Measurement  
This paper aims to develop an approach to test analog and mixed-signal embedded-core-based system-on-chips (SOCs) with built-in hardware. In particular, oscillation-based built-in self-test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this paper. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require
more » ... imulus generators or complex response analyzers, which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness, and relevance of the proposed implementations. Index Terms-Built-in self-test (BIST), circuit under test (CUT), design-for-testability (DFT), mixed-signal test, oscillationbased BIST (OBIST), system-on-chip (SOC), test-pattern generator (TPG).
doi:10.1109/tim.2007.894223 fatcat:2jcplbemsvfe5e6w64ce6psc4y