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Microstructure of a Cu film grown on bcc Ta (100) by large-scale molecular-dynamics simulations
2010
Physical Review B
Molecular-dynamics simulations using embedded atom method potentials were carried out to study the growth and subsequent annealing of a 6.3 monolayer thick Cu film on a bcc-Ta ͑100͒ substrate of a very large area ͑100ϫ 100 nm 2 ͒. The purpose is to obtain, for this typical example of a crystallographically incompatible system, atomic-level insight into the microstructural evolution of the film/substrate interface and the film itself, with the limiting influence of in-plane boundary conditions
doi:10.1103/physrevb.81.045410
fatcat:x3l7dmlf3nartp45ghxnowaivi