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Improving Reliability of Memory against Multiple Cell Upsets Using Decimal Matrix Code
unpublished
Transient multiple cell upsets (MCUs) are getting to be real issues in the unwavering quality of recollections presented to radiation environment. To keep MCUs from bringing about information defilement, more perplexing error correction codes (ECCs) are generally used to secure memory, yet the principle issue is that they would require higher defer overhead. As of late, network codes (MCs) in light of Hamming codes have been proposed for memory assurance. The principle issue is that they are
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