Failure Mode & Effect Analysis for Improving Data Veracity and Validity

Ana Elsa Hinojosa Herrera, Chris Walshaw, Chris Bailey, Chunyan Yin
2019 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE)  
Failure Mode & Effect Analysis (FMEA) is a method that has been used to improve reliability of products, processes, designs, and software for different applications, including electronics manufacturing. In this paper we propose a modification of this method to extend its application for data veracity and validity improvement. The proposed DVV-FMEA method is based on engineering features and in addition, provides transparency and understandability of the data and its pre-processing, making it reproducible and trustful.
doi:10.1109/iccece46942.2019.8941849 fatcat:q5gfkvyzdbbyxpvde6swq7ljam