Thin Film Evolution Equation for a Strained Anisotropic Solid Film on a Deformable Isotropic Substrate

Wondimu Tekalign, Agegnehu Atena
2018 Journal of Applied Mathematics and Physics  
We consider a continuum model for the evolution of an epitaxially-strained dislocation-free anisotropic thin solid film on isotropic deformable substrate in the absence of vapor deposition. By using a thin film approximation we derived a nonlinear evolution equation. We examined the nonlinear evolution equation and found that there is a critical film thickness below which every film thickness is stable and a critical wave number above which every film thickness is stable.
doi:10.4236/jamp.2018.64074 fatcat:xkgntseemzgvbjru2cmxhvf2qu