A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2018; you can also visit the original URL.
The file type is application/pdf.
Nabeeh Kandalaft, Ali Attaran, Rashid Rashizadeh. "High speed test interface module using MEMS technology." Microelectronics and reliability 55.2 (2015) 374-382