Ion beam imaging in a mass spectrometer using an MCP based imaging device

Y Kumar, R K Bhatia, S N Bindal, T K Saha, E Ravisankar, P Abhichandani, V Nataraju, V K Handu
2008 Journal of Physics, Conference Series  
The application of ion beam imaging devices in mass spectrometers is proving to be very useful for validating the ion optical designs. An attempt has been made to image the ion beam in mass spectrometer at two different locations -the first location is before the magnetic analyzer and the second one is at the final collector positions. Experimental results of beam imaging studies under varying beam conditions and with or without einzel lenses, will be presented. Results of simulation studies of
more » ... ion optics in the same mass spectrometer using commercial software will also be discussed. Experiments with a movable strip type collector at first location give to estimate the beam dimensions are also discussed.
doi:10.1088/1742-6596/114/1/012052 fatcat:xdg4pca7yrforcyonwpoax2u4m