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The application of ion beam imaging devices in mass spectrometers is proving to be very useful for validating the ion optical designs. An attempt has been made to image the ion beam in mass spectrometer at two different locations -the first location is before the magnetic analyzer and the second one is at the final collector positions. Experimental results of beam imaging studies under varying beam conditions and with or without einzel lenses, will be presented. Results of simulation studies ofdoi:10.1088/1742-6596/114/1/012052 fatcat:xdg4pca7yrforcyonwpoax2u4m