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Ion beam imaging in a mass spectrometer using an MCP based imaging device
2008
Journal of Physics, Conference Series
The application of ion beam imaging devices in mass spectrometers is proving to be very useful for validating the ion optical designs. An attempt has been made to image the ion beam in mass spectrometer at two different locations -the first location is before the magnetic analyzer and the second one is at the final collector positions. Experimental results of beam imaging studies under varying beam conditions and with or without einzel lenses, will be presented. Results of simulation studies of
doi:10.1088/1742-6596/114/1/012052
fatcat:xdg4pca7yrforcyonwpoax2u4m