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Physical Unclonable Functions (PUFs) are increasingly used for authentication and identification applications as well as cryptographic key generation. An important feature of a PUF is the reliance on minute random variations in the fabricated hardware to derive a trusted random key. Currently, most PUF designs focus on exploiting process variations intrinsic to CMOS technology. In recent years, progress in emerging nanoelectronic devices has demonstrated an increase in variation as adoi:10.1109/access.2015.2503432 fatcat:3x4sayz2draqxbbd6aubrnn4uy