Edge-effects and defect sizing by transient thermography

D.P. Almond, M.B. Saintey, S.K. Lau
1994 Proceedings of the 1994 International Conference on Quantitative InfraRed Thermography   unpublished
Thermal edge-effects for crack-like defects have been calculated using the Wiener-Hopf technique. These lead to an experimentally verified prediction that transient thermographic defect images shrink systematically with elapsed time. A simple method of defect sizing is proposed based on accounting for defect shrinkage. Finite difference modeling is used to investigate the dependence of image shrinkage on defect size and depth.
doi:10.21611/qirt.1994.037 fatcat:yla77esohrbkvac43sqpw2nbla