Fault tolerance of decomposed PLAs

O. Keren, I. Levin
2010 2010 East-West Design & Test Symposium (EWDTS)  
The paper deals with the fault tolerance of finite state machines (FSMs) implemented by nanoelectronic programmable logic arrays (PLAs). The paper studies a fault tolerant nano-PLA structure, which is based on implementing an initial FSM in a form of three interacting dense PLAs. The paper provides experimental benchmarks results for estimation of fault tolerance properties of the proposed solution. The results indicate a high efficiency of the proposed decomposition approach.
doi:10.1109/ewdts.2010.5742040 dblp:conf/ewdts/KerenL10 fatcat:n7pdnpkhobedbfz7znlt6euzga