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As defect detection using machine vision is diversifying and expanding, approaches using deep learning are increasing. Recently, there have been much research for detecting and classifying defects using image segmentation, image detection, and image classification. These methods are effective but require a large number of actual defect data. However, it is very difficult to get a large amount of actual defect data in industrial areas. To overcome this problem, we propose a method for defectdoi:10.3390/app10072511 fatcat:acjfnhuarzf37kjem35nuiakxm