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Mapping carbon nanotube orientation by fast fourier transform of scanning electron micrographs
A novel method of applying a two-dimensional Fourier transform (2D-FFT) to SEM was developed to map the CNT orientation in pre-formed arrays. Local 2D-FFTs were integrated azimuthally to determine an orientation distribution function and the associated Herman parameter. This approach provides data rapidly and over a wide range of lengthscales. Although likely to be applicable to a wide range of anisotropic nanoscale structures, the method was specifically developed to study CNT veils, a systemdoi:10.1016/j.carbon.2018.04.063 fatcat:v25i26ouufgs7fcr7vopqgwig4