Power and Reliability Management of SoCs

Tajana Simunic Rosing, Kresimir Mihic, Giovanni De Micheli
2007 IEEE Transactions on Very Large Scale Integration (vlsi) Systems  
Today's embedded systems integrate multiple IP cores for processing, communication, and sensing on a single die as systems-on-chip (SoCs). Aggressive transistor scaling, decreased voltage margins and increased processor power and temperature have made reliability assessment a much more significant issue. Although reliability of devices and interconnect has been broadly studied, in this work, we study a tradeoff between reliability and power consumption for component-based SoC designs. We
more » ... designs. We specifically focus on hard error rates as they cause a device to permanently stop operating. We also present a joint reliability and power management optimization problem whose solution is an optimal management policy. When careful joint policy optimization is performed, we obtain a significant improvement in energy consumption (40%) in tandem with meeting a reliability constraint for all SoC operating temperatures.
doi:10.1109/tvlsi.2007.895245 fatcat:erwfsmw43jhy5ah7fp764pgrxm