E-8 V(z)曲線法による膜の密着性評価(超音波顕微鏡)
E-8 Evaluation of adhesion of films by V(z) method

Noritaka Nakaso, Yusuke Tsukahara, Jun-ichi Kushibiki, Noriyoshi Chubachi
Proceedings of Symposium on Ultrasonic Electronics  
doi:10.24492/iuse.9.0_159 fatcat:ef3wbz4y2fgmldfo7blzr7dm34