Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz

J.R. Labenski, W.L. Tew, S.W. Nam, S.P. Benz, P.D. Dresselhaus, C.J. Burroughs
2007 IEEE Transactions on Instrumentation and Measurement  
A conventional technique for scaling temperatures in Johnson noise thermometry is via resistance ratios. We describe measurements from 1 kHz to 1 MHz using this approach via correlation methods in the frequency domain. We show that the effects of the mismatch in time constants of the input networks may be empirically treated to extract the noise power and temperature ratios in the low-frequency limit with uncertainties < 60 µK/K. Index Terms-Noise, noise measurement, temperature, temperature
more » ... ure, temperature measurement. Charles J. Burroughs, Jr. was born on June 18, 1966. He received the B.S. degree in electrical engineering from the University of Colorado, Boulder, in 1988. He worked with the National Institute of Standards and Technology (NIST), Boulder, first as a student and, since 1988, as a permanent staff member. At NIST, he has worked in the area of superconductive electronics, including the design, fabrication, and testing of Josephson voltage standards and digitalto-analog and analog-to-digital converters. He has 45 publications and three patents in the field of superconducting electronics.
doi:10.1109/tim.2007.891070 fatcat:ef5goapzevaeje5rdtl4x6aini