Dedicated autonomous scan-based testing (DAST) for embedded cores

M. Nahvi, A. Ivanov, R. Saleh
Proceedings. International Test Conference  
The complexity of today's chips is such that relying solely upon external ATE resources is insufficient for scan test. In this work, we develop the concept of dedicated autonomous scan-based testing (DAST) by proposing a scheme that introduces hierarchy and separates the functionality of ATE resources into two distinctive classes: a) test data communication, and b) test data control and observation. To simplify the ATE for embedded digital core testing, we propose transferring ATE test data
more » ... rol/observation functions to one or more Embedded Autonomous Sequencers (EAS) dedicated to single or multiple embedded cores of an SoC. We present implementation results of our DAST methodology when applied to a number of SoC benchmarks.
doi:10.1109/test.2002.1041876 dblp:conf/itc/NahviIS02 fatcat:dvvldgqeszeprobmn2mtvw6jcu