Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information

Y. TAKAMATSU, H. TAKAHASHI, Y. HIGAMI, T. AIKYO, K. YAMAZAKI
2008 IEICE transactions on information and systems  
In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult o know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method
more » ... s both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.
doi:10.1093/ietisy/e91-d.3.675 fatcat:2ywdh7k4xffp3erxnpjtrn3aze