Implementation of long-wavelength cut-off filters based on critical angle

Yanen Guo, J. A. Dobrowolski, Li Li, Daniel Poitras, Tom Tiwald
2011 Applied Optics  
Vous avez des questions? Nous pouvons vous aider. Pour communiquer directement avec un auteur, consultez la première page de la revue dans laquelle son article a été publié afin de trouver ses coordonnées. Si vous n'arrivez pas à les repérer, communiquez avec nous à PublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca. Our first attempts at the fabrication of long-wavelength infrared cut-off filters with extended transmission and rejection regions that are based on the use of the critical
more » ... of the critical angle, the dispersion of refractive indices, and on thin-film interference were not very successful. The design of the filter consisted of layers placed at the interface between two high-index prisms. Using the available deposition equipment, the layers produced were porous and very rough. The pores adsorbed water vapor, which resulted in absorption. The roughness made the process of optical contacting very difficult. In this paper we describe the adjustments in the design and deposition processes that allowed us to obtain filters with a better and more stable performance.
doi:10.1364/ao.50.00c396 pmid:21460971 fatcat:4jzkvc7svjhchflqgchbom3hpu