Determination Of The Junction Surface recombination Velocity Limiting The Open Circuit (Sfoc) For A Bifacial Silicon Solar Cell Under External Electric Field

P Marcel, Sitor Diouf, P Gohan, Amary Thiam, P Khady, Faye, P Moussa, Ibra Ngom, Doudou Gaye, Grégoire Sissoko, Anta Diop, Dakar Senegal (+2 others)
2015 IJISET-International Journal of Innovative Science, Engineering & Technology   unpublished
In this paper, we study the influence of the electric field on the junction recombination velocity limiting the open circuit. The excess of minority carrier's density in the base is determined from the continuity equation. The photovoltage and the open circuit voltage are derived from the excess minority carrier's density. From the photovoltage study, the junction recombination velocity limiting the open circuit and the open circuit voltage are determined and studied for different values of electric field and simultaneous illumination mode.
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