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Proceedings of the 21st ACM SIGGRAPH/EUROGRAPHICS symposium on Graphics hardware - GH '06
With shrinking process technology, the primary cause of transient faults in semiconductors shifts away from highenergy cosmic particle strikes and toward more mundane and pervasive causes-power fluctuations, crosstalk, and other random noise. Smaller transistor features require a lower critical charge to hold and change bits, which leads to faster microprocessors, but which also leads to higher transient fault rates. Current trends, expected to continue, show soft error rates increasingdoi:10.1145/1283900.1283902 fatcat:oonrcxopyvcd3f4sfweczzf7ia