A novel method for sub-micrometer transverse electron beam size measurements using optical transition radiation

A Aryshev, S T Boogert, D Howell, P Karataev, N Terunuma, J Urakawa
2010 Journal of Physics, Conference Series  
Optical Transition Radiation (OTR) appears when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by the Point Spread Function (PSF) dimension -the source distribution generated by a single electron and projected by an optical system onto a screen. For small electron beam
more » ... mensions, the PSF form significantly depends on various parameters of the optical system like diffraction of the OTR tails, spherical and chromatic aberrations, etc. In our experiment we managed to create a system which can practically measure the PSF distribution and using a new self-calibration method we are able to calculate transverse electron beam size. Here we represent the development, data analysis and novel calibration technique of a sub-micrometer electron beam profile monitor based on the measurements of the PSF shape, which visibility is sensitive to sub-micrometer electron beam dimensions.
doi:10.1088/1742-6596/236/1/012008 fatcat:ng3upmjt4fdobkh5m6nf3wia5q